ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 10    No. 5    October 2000

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Development of embedded-atom potentials and prediction of
properties for binary Ti-V①
SHANG Shun-li(商顺利), LIU Yu-qin(刘玉芹),
BAI Ke-wu(白克武), SHEN Jian-yun(沈剑韵), WANG Xi-zhe(王希哲)
(General Research Institute for Nonferrous Metals, Beijing 100088, P.R.China)
Abstract: The embedded atom potentials for binary Ti-V were developed and used to predict the mechanical properties of binary Ti-V solid solutions with hcp and bcc structures including lattice parameters, elastic constants and fracture toughness for Mode-Ⅰfracture under plane strain. The calculation results show that with the increment of V-content, the lattice parameters and elastic constants decrease but the fracture toughness increases for hcp solid solutions, the lattice parameters decrease but the elastic constants and fracture toughness increase for bcc solid solutions. The calculation results agree well with the available experiment values.
Key words: embedded atom potentials; Ti-V system; lattice parameters; elastic constants; fracture toughness
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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