ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 2    No. 2    May 1992

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THE SiOi H20 INTERFACE AND EFFECTS ON QUARTZ ACTIVATION IN FLOTATION SYSTEM
Sun Zhongxi1, Willis Forsling1, Chen Jin2
(1.Lulea University of Technology, S-951 87 Lulea, Sweden;
2.Central South University of Technology, Changsha 410083, China
)
Abstract: The correlation between surface complexation at the SiO2-H2O interface and quartz flotation behavior was studied. Computer assisted calculations, using the programs SOLGASWATER, were adapted in order to construct distribution diagrams of surface speciation in the SiO2-metal ion-H+ system in aqueous solutions. Equilibrium constants far both surface and solution reactions were introduced in the composition matrix. Surface complexation, surface charge as well as flotation results were compared and a good agreement was obtained.Furthermore, flotation mechanisms of quartz activation by common metal ions like Ca2+,Mg2+,Fe3+  are quantitatively discussed based on the surface reaction equilibrium constants.
Key words: surface complexation  SiO2-H2O interface  quartz flotation
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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