ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 15    No. 2    April 2005

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High electron mobility of modulation doped GaAs after growing InP by solid source molecular beam epitaxy
SHU Yong-chun(舒永春)1, PI Biao(皮 彪)1, LIN Yao-wang(林耀望)1,2
XING Xiao-dong(邢小东)1, YAO Jiang-hong(姚江宏)1
WANG Z
(1. Key Laboratory of Advanced Technique and Fabrication for Weak-Light Nonlinear Photonics Materials, Ministry of Education, Nankai University, Tianjin 300457, China; 
2. Key Laboratory for Semiconductor Materials Science, 
Chinese Academy of Sciences, Beijing 100083, China
)
Abstract:  Modulation-doped AlGaAs/GaAs structures were grown on GaAs(100) substrate by solid source molecular beam epitaxy(SSMBE) system. The factors which influence the electron mobility were investigated. After growing InP based materials, growth conditions were deteriorated, but by an appropriate method and using reasonable process high electron mobility(77K) of more than 1.50×105cm2/(V•s) can still be obtained. The structures and growth conditions have been studied and optimized via Hall measurements. For a typical sample, 2.0K electron mobility as high as 1.78×106cm2/(V•s) is achieved, and the quantum Hall oscillation phenomena can be observed.
Key words: modulation doped GaAs; high electron mobility; quantum Hall oscillation
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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