ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 16    No. 5    October 2006

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Correlation between discharging property and coatings microstructure during plasma electrolytic oxidation
GUAN Yong-jun(关永军), XIA Yuan(夏 原) 
(Institute of Mechanics, Chinese Academic of Science, Beijing100080, China)
Abstract:  The voltage-current properties during plasma electrolytic discharge were determined by measuring the current density and cell voltage as functions of processing time and then by mathematical transformation. Correlation between discharge I-V property and the coatings microstructure on aluminum alloy during plasma electrolytic oxidation was determined by comparing the voltage-current properties at different process stages with SEM results of the corresponding coatings. The results show that the uniform passive film corresponds to a I-V property with one critical voltage, and a compound of porous layer and sintered ceramic particles corresponds to a I-V property with two critical voltages. The growth regularity of PEO cermet coatings was also studied.
Key words: plasma electrolytic oxidation; discharge property; voltage—current curve; ceramic coating; aluminum alloy
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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