ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 12    No. 3    June 2002

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Investigation of average growth stresses in
Cr2O3 scales measured by a novel
deflection method
QIAN Yu-hai(钱余海), LI Mei-shuan(李美栓),
LIU Guang-ming(刘光明 ), XIN Li(辛  丽)
(State Key Laboratory for Materials Science, Institute of Metal Research,
The Chinese Academy of Sciences, Shenyang 110016, China
)
Abstract: The stress in the oxide film plays an important role to keep it intact so it is necessary to determine the stress in the oxide scale. Average growth stresses in Cr2O3 scales formed on Ni-base alloy (Ni80Cr20) at 1000℃ in air w ere investigated by a novel deflection technique. It is found that the growth stress in the oxide scale is basically compressive and its average order is 100MPa. The stress values are high for the thin scales and become low for thick scales after oxidized for 10h. The planar stress distribution in metals is complex. It is both compressive and tensile at the beginning of oxidation procedure, and then become only tensile during further oxidation.
Key words: growth stress; deflection test; creep analysis; Cr2O3 scale
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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