ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 20    No. 2    February 2010

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Thermal residual stress of polycrystalline diamond compacts
CHEN Feng(陈 枫)1, XU Gen(徐 根)2, MA Chun-de(马春德)1, XU Guo-ping(徐国平)3
(1. Testing Center, Central South University, Changsha 410083, China;
2. School of Resources and Safety Engineering, Central South University, Changsha 410083, China;
3. King-ray New Materials Science & Technology Co., Ltd., Changsha 410012, China
)
Abstract: Thermal residual stresses in polycrystalline diamond compact (PDC) cutter arising from the difference in thermal expansion between the polycrystalline diamond (PCD) and the supporting tungsten carbide substrate after sintering at high pressure and high temperature were investigated using finite element simulation, laboratory tests and theoretical analysis. The obtained results show that although compressive residual stresses exist both in the interface of PCD table and in the most region of PCD table surface, the tensile residual stress, which is a fatal shortage to PDC, can also occur near the outer diameter area of PCD table, and the maximum value is 690 MPa. Distribution of tensile stress in the PCD table is given through experimental results, which is well consistent with the numerical results. This finding may be significant in designing new PDC cutters with lower residual stress and high cutting behavior.
Key words: polycrystalline diamond compact; diamond; thermal residual stress; stress release
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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