ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 9    No. 4    December 1999

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Electronic structure and physical property of TiAl
Gao Yingjun';Chen Zhenhua;Huang Peiyun and Zhong Xiaping
(1.Physical DePartment, GUangxi University, Nanning 530004, P. R. China;
2.Institute of Nonequilibrium Materials Research,Central South University of Technology, Changsha 410083, P. R. China
)
Abstract: Using a new developed valence bond theory of intermetallic compound, the electronic structure and properties of TiAl were analysed systematically. It was determined that the valence electronic structure of Ti and Al atom in TiAl to be [ (4sf)0.42 (4sc) 1.36 (3dc)2.22]Ti and[ (3sf)0.39 (3sc)0.59 (3dc)2.02 ] Al respectively. According to these electronic structure, lattice constant, cohesive energy, potential curve, bulk modulus and temperature dependence of linear thermal expansion coefficient have been calculated, most of the theoretical values of these properties are in good agreement with experiment ones.
Key words: TiAl; electronic structure; physical properties
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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