XPS study of BZT thin film deposited on Pt/Ti/SiO2/Si substrate by
pulsed laser deposition
pulsed laser deposition
(1. School of Physics & Optoelectric Engineering, Guangdong University of Technology,
Guangzhou Higher Education Mega Center, Guangzhou 510006, China;
2. Key Laboratory of Low Dimensional Materials and Application Technology, Xiangtan University,
Xiangtan 411105, China)
Guangzhou Higher Education Mega Center, Guangzhou 510006, China;
2. Key Laboratory of Low Dimensional Materials and Application Technology, Xiangtan University,
Xiangtan 411105, China)
Abstract: Ferroelectric materials were widely applied for actuators and sensors. Barium zirconate titanate Ba(Zr0.25Ti0.75)O3 thin film was grown on Pt/Ti/SiO2/Si(100) substrates by pulsed laser deposition. Structure and surface morphology of the thin film were studied by X-ray diffractometry (XRD) and scan electronic microscopy (SEM). The composition and chemical state near the film surface were obtained by X-ray photoelectron spectroscopy (XPS). On the sample surface, O 1s spectra can be assigned to those from the lattice and surface adsorbed oxygen ions, while C1s only result from surface contamination. The result shows that only one chemical state is found for each spectrum of Ba 3d, Zr 3d and Ti 2p photoelectron in the BZT thin film.
Key words: chemical state; XPS; BZT thin film; pulsed laser deposition