Modifying factor for determining broadband complex permeability of
magnetic thin films
magnetic thin films
(Department of Electronic Science and Technology, Huazhong University of Science and Technology,
Wuhan 430074, China)
Wuhan 430074, China)
Abstract: A new method of the modifying factor for determining the broadband complex permeability of magnetic thin films, was proposed. Based on the measurement technology of shot-end microstrip line and the new modify factor, a series of FeCo-based magnetic thin films deposited on the oxidized silicon substrates and with an in-plane uniaxial anisotropy were measured in the frequency range of 0.5−5 GHz. The results fit well with the Landau-Lifchitz-Gilbert theory in a broad frequency range.
Key words: magnetic thin films; microwave measurement; complex permeability; microstrip line; high frequency structure simulation