ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 17    Special 1    November 2007

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Microstructure and electric properties of Sip/Al composites for
 electronic packaging applications
XIU Zi-yang(修子扬), WU Gao-hui(武高辉), ZHANG Qiang(张  强),
SONG Mei-hui(宋美慧), TIAN Shou-fu(田首夫)
(School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, China)
Abstract: Sip/1199, Sip/4032 and Sip/4019 environment-friendly composites for electronic packaging applications with high volume fraction of Si particles were fabricated by squeeze-casting technology. Effects of microstructure, particle volume fraction, particle size, matrix alloy and heat treatment on the electrical properties of composites were discussed, and the electrical conductivity was calculated by theoretical models. It is shown that the Si/Al interfaces are clean and do not have interface reaction products. For the same matrix alloy, the electrical conductivity of composites decreases with increasing the reinforcement volume fraction. As for the same particle content, the electrical conductivity of composites decreases with increasing the alloying element content of matrix. Particle size has little effects on the electrical conductivity. Electrical conductivity of composites increases slightly after annealing treatment. The electrical conductivity of composites calculated by P.G model is consistent with the experimental results.
Key words: Si/Al composite; microstructure; electric conductivity; electronic packaging
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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