X-ray diffraction analysis of cold-worked Cu-Ni-Si and
(A. KHEREDDINE, F. HADJ LARBI, L. DJEBALA, H. AZZEDDINE, B. ALILI, D. BRADAI
Faculté de Physique, USTHB, BP 32 El-Alia, Dar El Beida, Alger, Algérie)
Faculté de Physique, USTHB, BP 32 El-Alia, Dar El Beida, Alger, Algérie)
Abstract: Cold worked and annealed supersaturated Cu-2.65Ni-0.6Si and Cu-2.35Ni-0.6Si-0.6Cr alloys were studied. The microstructural parameters evolution, including crystallite size, root mean square strain and dislocation density was analyzed using Materials Analysis Using Diffraction software (MAUD). The parameters for both alloys have typical values of cold deformed and subsequently annealed copper based alloy. A net change of the crystallite size, root mean square strain and dislocation density values of the alloys aged at 450 °C for 2.5−3 h seems corresponding to the recovery and recrystallization processes. Addition of Cr as quaternary element did not lead to any drastic changes of post deformation or ageing microstructural parameters and hence of recovery-recrystallization kinetics.
Key words: Cu-Ni-Si alloy; microstructure; XRD line profile analysis; Materials Analysis Using Diffraction software