ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 22    No. 8    August 2012

[PDF]    [Flash]
Interfacial characteristics and microstructural evolution of Sn-6.5Zn solder/Cu substrate joints during aging
ZHAO Guo-ji, SHENG Guang-min, WU Li-li, YUAN Xin-jian
(College of Materials Science and Engineering, Chongqing University, Chongqing 400044, China)
Abstract: The influence of isothermal aging at 150 °C on the microstructural characteristics and microhardness of the Sn-6.5Zn solder/Cu joint was studied. The mechanisms for the formation and evolution of intermetallic compound (IMC) at the interface of the Sn-6.5Zn/Cu joint were also analyzed. The results indicate that a continuous layer consisting of CuZn and Cu5Zn8 IMCs is formed in the interface zone. As the aging time prolongs, the thickness of the IMC layer first increases and then decreases, and the continuous and compactable layer is destroyed due to the decomposition of the Cu-Zn IMC layer. A discontinuous layer of Cu6Sn5 IMC is present within the Cu substrate near the decomposed region. The interface becomes rough and evident voids form after aging. The microhardness of the interface increases owing to the application of aging.
Key words: Sn-6.5Zn solder; interface; intermetallic compound; aging; evolution
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
Managed by Central South University (CSU) 湘ICP备09001153号-9