ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 22    No. 12    December 2012

[PDF]    [Flash]
Nanogrinding of SiC wafers with high flatness and low subsurface damage
HUO Feng-wei, GUO Dong-ming, KANG Ren-ke, FENG Guang
(Key Laboratory for Precision and Non traditional Machining of Ministry of Education,
Dalian University of Technology, Dalian 116024, China
)
Abstract: Nanogrinding of SiC wafers with high flatness and low subsurface damage was proposed and nanogrinding experiments were carried out on an ultra precision grinding machine with fine diamond wheels. Experimental results show that nanogrinding can produce flatness less than 1.0 μm and a surface roughness Ra of 0.42 nm. It is found that nanogrinding is capable of producing much flatter SiC wafers with a lower damage than double side lapping and mechanical polishing in much less time and it can replace double side lapping and mechanical polishing and reduce the removal amount of chemical mechanical polishing.
Key words: SiC wafer; nanogrinding; cup wheel; flatness; surface roughness; damage
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
Managed by Central South University (CSU) 湘ICP备09001153号-9