Effects of deposition parameters on HFCVD diamond films growth on inner hole surfaces of WC-Co substrates
(School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China)
Abstract: Deposition parameters that have great influences on hot filament chemical vapor deposition (HFCVD) diamond films growth on inner hole surfaces of WC-Co substrates mainly include the substrate temperature (t), carbon content (φ), total pressure (p) and total mass flow (F). Taguchi method was used for the experimental design in order to study the combined effects of the four parameters on the properties of as-deposited diamond films. A new figure-of-merit (FOM) was defined to assess their comprehensive performance. It is clarified that t, φ and p all have significant and complicated effects on the performance of the diamond film and the FOM, which also present some differences as compared with the previous studies on CVD diamond films growth on plane or external surfaces. Aiming to deposit HFCVD diamond films with the best comprehensive performance, the key deposition parameters were finally optimized as: t=830 °C, φ=4.5%, p=4000 Pa, F=800 mL/min.
Key words: hot filament chemical vapor deposition diamond film; inner hole surface; Taguchi method; deposition parameter; optimization