TEM study on Si0.65Ge0.35/p-Si HIP infrared detector
Liu Ansheng(刘安生), Shao Beiling(邵贝羚), Liu Zheng(刘 峥), Wang Jing(王 敬)
TEM study on Si0.65Ge0.35/p-Si HIP infrared detector
Liu Ansheng(刘安生), Shao Beiling(邵贝羚), Liu Zheng(刘 峥), Wang Jing(王 敬)
中国有色金属学报(英文版)
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1999, (03): 481
-486
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