Microstructure and electrical properties of CeO2 ultra-thin filmsfor MFIS FeRAM applications
TANGMing-hua(唐明华),ZHOUYi-chun(周益春),ZHENGXue-jun(郑学军),WEIQiu-ping(魏秋平),CHENGChuan-pin(成传品),YEZhi
Microstructure and electrical properties of CeO2 ultra-thin filmsfor MFIS FeRAM applications
TANGMing-hua(唐明华),ZHOUYi-chun(周益春),ZHENGXue-jun(郑学军),WEIQiu-ping(魏秋平),CHENGChuan-pin(成传品),YEZhi
中国有色金属学报（英文版）
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2007, (Special 1): 741
-746
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