Effect of external stress on phase diagrams and dielectric properties of epitaxial ferroelectric thin films grown on orthorhombic substrates

LÜYe-gang(吕业刚),DENGShui-feng(邓水凤),GONGLun-jun(龚伦军),YANGJian-tao(杨建桃)

Transactions of Nonferrous Metals Society of China ›› 2006, Vol. 16 ›› Issue (04) : 912-916.

Transactions of Nonferrous Metals Society of China ›› 2006, Vol. 16 ›› Issue (04) : 912-916.
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Effect of external stress on phase diagrams and dielectric properties of epitaxial ferroelectric thin films grown on orthorhombic substrates

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2006, 16(04): 912-916

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