Microstructure and electrical properties of CeO2 ultra-thin filmsfor MFIS FeRAM applications
TANGMing-hua(唐明华),ZHOUYi-chun(周益春),ZHENGXue-jun(郑学军),WEIQiu-ping(魏秋平),CHENGChuan-pin(成传品),YEZhi
Transactions of Nonferrous Metals Society of China ›› 2007, Vol. 17 ›› Issue (Special 1) : 741-746.
Microstructure and electrical properties of CeO2 ultra-thin filmsfor MFIS FeRAM applications
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